Förbrukningsmaterial
SEM sample stubs
A wide variety of functions and sizes for all the major microscopes
The sample stubs and mounts are in general made from vacuum grade aluminum and are machined according to the original manufacturer’s specifications and dimensions.
Not sure which type of stub to use with the microscope? Simply scroll down to the guide below or contact us – we’d be happy to help!
SEM stubs
- Standard SEM pin stubs and mounts
- Flat SEM pin stubs (Ø6,4 to Ø100 mm)
- Angled pin stubs (30°, 45°, 70° or 90°, single or double)
- Low-profile pin stubs (horizontal or pre-tilted)
- Engraved pin stubs
- Swivel pin mount
- Dish cylinder stub
- High purity carbon pin stub
- Short pin Zeiss stubs
- Flat SEM pin stubs (Ø6,4 to Ø100 mm)
- Angled pin stubs (45° or 90°)
- Low-profile pin stubs (horizontal or pre-tilted, single or double)
- Flat pin stubs with extra height
- Engraved pin stubs
- JEOL cylinder stubs
- Flat cylinder stubs (Ø9,5 to Ø50 mm)
- Angled cylinder stubs (45° or 90°, single or double)
- Stub swivel mount
- Dish cylinder stubs
- Hitachi M4 cylinder stubs
- Flat cylinder stubs (Ø15 to Ø100 mm)
- Angled cylinder stubs (45° or 90°, single or double)
- Stub swivel mount
- Dish cylinder stubs
- Stub extender
- High purity carbon cylinder stub
- Gatan 3View pin stubs
- Hitachi In Lens sample mounts
SEM stub adapters
- SEM sample stub adapters
- Pin stub adapters
- JEOL stub adapters
- Hitachi M4 stub adapters
SEM stub type and the respective brands – a short guide
- Standard pin stubs and mounts
- FEI
- Phillips
- Tescan
- Phenom
- AmRay
- Cambridge Instruments
- Thermo Fisher
- Leica
- CamScan
- Aspex
- RJLee
- Etec
- Novascan
- Short pin stubs
- Zeiss and LEO SEMs
- JEOL cylinder stubs
- JEOL SEMs
- Hitachi cylinder stubs
- Hitachi standard stubs with M4 threaded hole in the base
- Gatan pin stubs
- SEMs with Gatan 3View
- Hitachi In Lens sample mounts
- Hitachi In Lens FESEMs
Please contact us for assistance or more information.
